Negative bias temperature stress on low voltage p-channel DMOS transistors and the role of nitrogen.

S. Gamerith M. Pölzl

Published in: Microelectron. Reliab. (2002)

Keyphrases

low voltage
cmos technology
room temperature
low power
design considerations
power management
power consumption
power line
real time
low cost
high speed
learning experience
multi channel
high density
field effect transistors