Classification using a three-dimensional sensor in a structured industrial environment.
Ivan MikhailovIgor JovancevicNour Islam MokhtariJean-José OrteuPublished in: J. Electronic Imaging (2020)
Keyphrases
- three dimensional
- industrial environment
- pattern recognition
- classification accuracy
- pattern classification
- classification method
- support vector machine
- preprocessing
- machine learning
- svm classifier
- benchmark datasets
- multi view
- support vector
- decision trees
- face recognition
- real time
- structured output
- structured learning
- classification process
- classification systems
- classification scheme
- classification models
- image processing
- feature space
- feature extraction
- machine learning algorithms
- support vector machine svm
- training samples
- training data
- sensor networks
- object recognition
- active learning