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Picoseconds measurement of internal waveforms in integrated circuits using sampling force probing. I. Principle and demonstration.

Ra'a A. Said
Published in: ISCAS (2000)
Keyphrases
  • integrated circuit
  • electron beam
  • sampling strategies
  • random sampling
  • internal and external
  • monte carlo
  • sample size
  • sampling strategy
  • support vector
  • data acquisition
  • sampling algorithm
  • real time
  • force feedback