Evaluation of Information Leakage from Cryptographic Hardware via Common-Mode Current.

Yu-ichi Hayashi Naofumi Homma Takaaki Mizuki Takeshi Sugawara Yoshiki Kayano Takafumi Aoki Shigeki Minegishi Akashi Satoh Hideaki Sone Hiroshi Inoue

Published in: IEICE Trans. Electron. (2012)

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