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Parameterized Modeling of Open-Circuit Critical Volume for Three-Dimensional Defects in VLSI Processing.
M. K. Kidambi
Akhilesh Tyagi
Mohammed R. Madani
Magdy A. Bayoumi
Published in:
VLSI Design (1994)
Keyphrases
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three dimensional
high speed
object modeling
signal processing
neural network
vlsi circuits
printed circuit boards
low power
image sequences
real time
data processing
x ray
range images
feature extraction
modeling language
modeling method
distributed processing
volume rendering
case study