Constructing Control Process for Wafer Defects Using Data Mining Technique.
Leeing TongHsingyin LeeChifeng HuangChangke LinChienhui YangPublished in: ICEB (2004)
Keyphrases
- data mining techniques
- data mining
- data warehouse
- process control
- association rule mining
- cluster analysis
- control system
- association rules
- data mining process
- knowledge discovery
- manufacturing process
- real world
- intrusion detection
- data mining methods
- control charts
- data structure
- integrated circuit
- text mining
- k means
- data analysis