Stochastic-Expansions-Based Model-Assisted Probability of Detection Analysis of the Spherically-Void-Defect Benchmark Problem.
Xiaosong DuPraveen GurralaLeifur LeifssonJiming SongWilliam Q. MeekerRonald A. RobertsSlawomir KozielYonatan A. TesfahunegnPublished in: ICCS (2) (2018)
Keyphrases
- mathematical model
- computational model
- probability model
- probability distribution
- statistical model
- detection algorithm
- social networks
- management system
- stochastic nature
- learning algorithm
- prediction model
- simulation model
- automatic detection
- input data
- object detection
- cost function
- prior knowledge
- multiscale
- high level
- computer vision