A Supervised Contrast Focus Neural Network for LED packaging defects classification.
Jiajun ChenHongpeng YinYan QinDandan ZhaoWeijie JiangPublished in: SAFEPROCESS (2023)
Keyphrases
- neural network
- machine learning
- pattern recognition
- supervised learning
- learning vector quantization
- classification scheme
- unsupervised learning
- supervised classification
- feature selection
- feature extraction
- decision trees
- classification accuracy
- support vector
- text classification
- artificial neural networks
- machine learning methods
- benchmark datasets
- feature vectors
- classification systems
- feature space
- preprocessing
- pattern classification
- multi layer perceptron
- classification algorithm
- support vector machine svm
- genetic algorithm
- data sets
- training data
- support vector machine
- machine learning algorithms
- incremental learning
- kohonen self organizing map
- nearest neighbour
- pairwise
- fuzzy logic
- automatic classification
- training process
- classification models
- semi supervised
- neural network model
- classification rules
- training samples
- classification method
- svm classifier
- class labels
- back propagation