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Picoseconds measurement of internal waveforms in integrated circuits using sampling force probing. II. Applications, capabilities, and limitations.
Ra'a A. Said
Published in:
ISCAS (2000)
Keyphrases
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integrated circuit
random sampling
processing capabilities
electron beam
internal and external
sampling strategies
active learning
sampling strategy
internal states
data sets
monte carlo
sampling algorithm
printed circuit boards
sampled data