A scaleable, statistical SPICE Gummel-Poon model for SiGe HBTs.
K. M. WalterB. EbersmanD. A. SunderlandG. D. BergGreg G. FreemanRobert A. GrovesD. K. JadusDavid L. HaramePublished in: IEEE J. Solid State Circuits (1998)
Keyphrases
- statistical model
- high level
- computational model
- management system
- conceptual model
- formal model
- prior knowledge
- simulation model
- probabilistic model
- sensitivity analysis
- mathematical model
- linear model
- database
- neural network model
- statistical methods
- hierarchical structure
- statistical models
- experimental data
- process model
- parameter estimation
- theoretical analysis
- cost function
- social networks
- machine learning