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Estimation of Collector Current Spreading in InGaAs SHBT Having 75-nm-Thick Collector.

Yasuyuki MiyamotoShinnosuke TakahashiTakashi KobayashiHiroyuki SuzukiKazuhito Furuya
Published in: IEICE Trans. Electron. (2010)
Keyphrases
  • computer vision
  • estimation error
  • database
  • neural network
  • metadata
  • image segmentation
  • database systems
  • markov random field
  • parametric models
  • error analysis
  • estimation accuracy