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Novel Technique for Location Identification and Estimation of Extent of Turn-to-Turn Fault in Transformer Winding.

Abhishek KumarBhavesh R. BhaljaGanesh Balu Kumbhar
Published in: IEEE Trans. Ind. Electron. (2023)
Keyphrases
  • fault diagnosis
  • machine learning
  • feature selection
  • three dimensional
  • data structure
  • image registration
  • accurate estimation