An advanced bit-line clamping scheme in magnetic RAM for wide sensing margin.

Jong-Chul Lim Hye-Seung Yu Jae-Suk Choi Soo-Won Kim

Published in: ASP-DAC (2005)

Keyphrases

random access memory
protection scheme
magnetic tape
wide range
design considerations
low voltage
sensor networks
objective function
training set
line segments
solid state
bit string