Login / Signup

ASN.1 and ROS: the impact of X.400 on OSI.

James E. White
Published in: IEEE J. Sel. Areas Commun. (1989)
Keyphrases
  • reference model
  • neural network
  • data analysis
  • pattern recognition
  • special case
  • probabilistic model
  • factors that influence
  • high level
  • multiscale
  • objective function
  • software engineering
  • high impact