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C-Axis Textured, 2-3 μm Thick Al0.75Sc0.25N Films Grown on Chemically Formed TiN/Ti Seeding Layers for MEMS Applications.

Asaf CohenHagai CohenSidney R. CohenSergey KhodorovYishay FeldmanAnna KossoyIfat Kaplan-AshiriAnatoly I. FrenkelEllen WachtelIgor LubomirskyDavid Ehre
Published in: Sensors (2022)
Keyphrases
  • multi layer
  • information systems
  • multi view
  • single layer
  • film restoration
  • ni fe
  • database
  • real time
  • bit rate
  • cross section
  • lagrange interpolation
  • texas instruments