Detection of local stiffness and piezoelectric properties of materials via piezoresponse force microscopy.
Amin Salehi-KhojinSaeid BashashNader JaliliGary Lee ThompsonAlexey VertegelPublished in: ACC (2009)
Keyphrases
- object detection
- automatic detection
- detection method
- high throughput
- detection algorithm
- false positives
- false alarms
- desirable properties
- image stacks
- data sets
- high voltage
- position control
- automated detection
- detection scheme
- detection accuracy
- structural properties
- detection rate
- anomaly detection
- neural network