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Characterization Methodology for MOSFET Local Systematic Variability in Presence of Statistical Variability.
Omar Jonani Franco Piliado
Giancarlo Castaneda
Andre Juge
Gérard Ghibaudo
Published in:
J. Low Power Electron. (2014)
Keyphrases
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software product line
neural network
information retrieval
evolutionary algorithm
statistical analysis
feature selection
image processing
image segmentation
expert systems
probabilistic model
statistical models
qualitative and quantitative
statistical information
statistical inference