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Critical transistors nexus based circuit-level aging assessment and prediction.
Nicoleta Cucu Laurenciu
Sorin Dan Cotofana
Published in:
J. Parallel Distributed Comput. (2014)
Keyphrases
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prediction accuracy
circuit design
high speed
wet lab
higher level
power consumption
prediction error
lower level
face recognition
low cost
prediction model
low power
levels of abstraction
cmos technology
multiple input