Runtime Stress Estimation for Three-dimensional IC Reliability Management Using Artificial Neural Network.
Hai WangTao XiaoDarong HuangLang ZhangChi ZhangHe TangYuan YuanPublished in: ACM Trans. Design Autom. Electr. Syst. (2019)
Keyphrases
- using artificial neural networks
- three dimensional
- artificial neural networks
- d objects
- friction coefficient
- information management
- management system
- data processing
- accurate estimation
- neural network model
- image sequences
- finite element analysis
- multi view
- decision support
- estimation process
- neural network
- decision making
- project management
- information systems
- estimation algorithm
- range images
- estimation accuracy
- network management
- integrated circuit
- estimation error
- density estimation
- surface reconstruction
- virtual reality
- x ray
- computer vision
- genetic algorithm