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Reliability of STT-MRAM for various embedded applications.
Shinhee Han
Junghyuk Lee
Kiseok Suh
Kyungtae Nam
Daeeun Jeong
Sechung Oh
Sohee Hwang
Yongsung Ji
Kilho Lee
Kangho Lee
Yoonjong Song
Yeongki Hong
Gitae Jeong
Published in:
IRPS (2021)
Keyphrases
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design considerations
embedded systems
search engine
computer vision
highly reliable
data sets
data mining
learning algorithm
artificial intelligence
e learning
image sequences
evolutionary algorithm
low cost
reliability assessment