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Minimum fault coverage in memory arrays: a fast algorithm and probabilistic analysis.

Chor Ping LowHon Wai Leong
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1996)
Keyphrases
  • statistical analysis
  • learning algorithm
  • case study
  • artificial neural networks
  • data driven
  • image analysis
  • special case
  • probability theory
  • memory space