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Analysis of 8T SRAM Cell at Various Process Corners at 65 nm Process Technology.

Shilpi BirlaNeeraj Kumar ShuklaKapil RathiRakesh Kumar SinghManisha Pattanaik
Published in: Circuits Syst. (2011)
Keyphrases
  • statistical analysis
  • real world
  • case study
  • mobile devices
  • development process