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Helium Ion Microscope-Assisted Nanomachining of Resonant Nanostrings.

Wei ZhengPeng LiRemko van den HurkStephane Evoy
Published in: Sensors (2016)
Keyphrases
  • frequency band
  • visual inspection
  • pulse width
  • pairwise
  • laser scanning
  • high energy
  • reinforcement learning
  • data streams