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MICOM IV&V planning approach and experience involving software reliability.

Robert E. LoeshArthur B. GosnellJames D. JohannesRichard M. WyskidaStephen E. Zutaut
Published in: ISSRE (1995)
Keyphrases
  • software reliability
  • software testing
  • prediction model
  • wavelet neural network
  • bp neural network
  • multiple linear regression
  • least squares
  • test cases