Characterizing Pattern Dependent Delay Effects in DDR Memory Interfaces.

Atul Gupta Ajay Kumar Manas Chhabra

Published in: Asian Test Symposium (2011)

Keyphrases

pattern matching
associative memory
user interface
memory usage
critical path
databases
memory requirements
memory space
pattern detection
real time
knowledge base
website
pattern discovery
computing power
state information
memory size