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-shift problem of Hf/polysilicon-based gate stacks: a solution-based survey.
W. Deweerd
Vidya Kaushik
J. Chen
Y. Shimamoto
Tom Schram
L.-Å. Ragnarsson
Annelies Delabie
Luigi Pantisano
B. Eyckens
J. W. Maes
Published in:
Microelectron. Reliab. (2005)
Keyphrases
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high frequency
optimal solution
wavelet transform
random access memory