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-shift problem of Hf/polysilicon-based gate stacks: a solution-based survey.

W. DeweerdVidya KaushikJ. ChenY. ShimamotoTom SchramL.-Å. RagnarssonAnnelies DelabieLuigi PantisanoB. EyckensJ. W. Maes
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • high frequency
  • optimal solution
  • wavelet transform
  • random access memory