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Performance comparison of channel engineered deep sub-micrometer pseudo SOI n-MOSFETs.

Partha SarkarAbhijit MallikChandan Kumar Sarkar
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • neural network
  • information systems
  • case study
  • multi channel
  • deep learning
  • field effect transistors
  • statistical analysis
  • channel capacity