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Uncertainties Caused by Noise for Microwave Interferometric and Reflection Measurements of Extreme Reflection Coefficients.
Martin Haase
Karel Hoffmann
Published in:
IEEE Trans. Instrum. Meas. (2023)
Keyphrases
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linear combination
image reconstruction
specular reflection
measurement noise
neural network
denoising
light source
noise model
noisy environments
measurement errors
imaging artifacts