Deep Learning based MURA Defect Detection.
Ramya Bagavath SinghGaurav KumarGaurav SultaniaShashank Shrikant AgashePriya Ranjan SinhaChulmoo KangPublished in: EAI Endorsed Trans. Cloud Syst. (2019)
Keyphrases
- deep learning
- defect detection
- liquid crystal displays
- unsupervised learning
- unsupervised feature learning
- machine learning
- feature extraction
- mental models
- image formation
- weakly supervised
- high resolution
- thin film
- generative model
- eye tracking
- motion blur
- visual attention
- image quality
- multiresolution
- viewpoint
- reinforcement learning
- multiscale
- computer vision