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Improving Testability and Reliability of Advanced SRAM Architectures.

Josef KinseherMoritz VölkerIlia Polian
Published in: IEEE Trans. Emerg. Top. Comput. (2019)
Keyphrases
  • power consumption
  • data transmission
  • databases
  • website
  • multiscale
  • high speed
  • reliability analysis
  • neural network
  • software engineering
  • low power
  • parallel architectures
  • neural architectures