A new approach for classification of fingerprint image quality.
Jun WuShan Juan XieDong-Hun SeoWon Don LeePublished in: IEEE ICCI (2008)
Keyphrases
- pattern recognition
- image classification
- support vector machine
- classification accuracy
- classification method
- classification scheme
- machine learning
- supervised learning
- decision trees
- feature space
- feature vectors
- classification systems
- automatic classification
- text classification
- pattern classification
- support vector machine svm
- machine learning methods
- high dimensionality
- benchmark datasets
- feature set
- unsupervised learning
- preprocessing
- feature extraction
- feature selection
- fingerprint image quality
- model selection
- classification models
- classification algorithm
- class labels
- naive bayes
- support vector
- learning algorithm