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0.21%-Native-BER EE SRAM Physically Unclonable Function With 2-D Power-Gated Bit Cells and ${V}_{\text{SS}}$ Bias-Based Dark-Bit Detection.

Kunyang LiuYue MinXuan YangHanfeng SunHirofumi Shinohara
Published in: IEEE J. Solid State Circuits (2020)
Keyphrases
  • random access memory
  • power consumption
  • false positives
  • information retrieval
  • database
  • detection algorithm
  • false alarms
  • magnetic tape
  • text retrieval
  • bit error rate
  • power management
  • channel capacity
  • ridge detection