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0.21%-Native-BER EE SRAM Physically Unclonable Function With 2-D Power-Gated Bit Cells and ${V}_{\text{SS}}$ Bias-Based Dark-Bit Detection.
Kunyang Liu
Yue Min
Xuan Yang
Hanfeng Sun
Hirofumi Shinohara
Published in:
IEEE J. Solid State Circuits (2020)
Keyphrases
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random access memory
power consumption
false positives
information retrieval
database
detection algorithm
false alarms
magnetic tape
text retrieval
bit error rate
power management
channel capacity
ridge detection