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Failure modes and mechanism analysis of SiC MOSFET under short-circuit conditions.

Xi JiangJun WangJiwu LuJianjun ChenXin YangZongjian LiChunming TuZheng John Shen
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • failure modes
  • quantitative analysis
  • sufficient conditions
  • real time
  • wireless sensor networks
  • qualitative analysis
  • fault tree