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Analytical yield prediction considering leakage/performance correlation.
Rajeev R. Rao
Anirudh Devgan
David T. Blaauw
Dennis Sylvester
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2006)
Keyphrases
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prediction accuracy
prediction error
prediction model
high prediction accuracy
prediction algorithm
real time
real world
information systems
multimedia
case study
multiscale
computational complexity
probabilistic model
correlation analysis