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A study of the effect of degradation of the aluminium metallization layer in the case of power semiconductor devices.
S. Pietranico
Stéphane Lefebvre
S. Pommier
M. Berkani Bouaroudj
S. Bontemps
Published in:
Microelectron. Reliab. (2011)
Keyphrases
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semiconductor devices
three dimensional
empirical studies
experimental study
neural network
genetic algorithm
database systems
optimal solution
power consumption