Login / Signup
Finding a Needle in the Haystack: Attention-Based Classification of High Resolution Microscopy Images.
Naofumi Tomita
Behnaz Abdollahi
Jason Wei
Bing Ren
Arief A. Suriawinata
Saeed Hassanpour
Published in:
CoRR (2018)
Keyphrases
</>
microscopy images
high resolution
low resolution
laser scanning
feature vectors
pattern recognition
multi channel
neural network
feature selection
similarity measure
image data
electron microscopy