Circuit-level classification and testability analysis for CMOS faults.
Scott F. MidkiffS. Wayne BollingerPublished in: VTS (1991)
Keyphrases
- pattern recognition
- high speed
- image classification
- decision trees
- classification algorithm
- machine learning algorithms
- statistical analysis
- supervised learning
- feature extraction
- machine learning
- classification accuracy
- support vector machine
- training set
- preprocessing
- data analysis
- feature vectors
- higher level
- benchmark datasets
- classification rules
- pattern classification
- automatic classification
- circuit design
- low voltage