Management of Critical Areas and Defectivity Data for Yield Trend Modeling.
Sandrine BarberanFrederic DuvivierPublished in: DFT (1998)
Keyphrases
- data processing
- data sets
- data analysis
- database
- spatial data
- data management
- complex data
- application domains
- knowledge management
- data structure
- high quality
- training data
- stored data
- original data
- raw data
- experimental data
- information systems
- relational databases
- synthetic data
- data collection
- small number
- computer systems
- information technology
- data quality
- big data
- machine learning
- data sources