Login / Signup
Frederic Duvivier
Publication Activity (10 Years)
Years Active: 1993-1999
Publications (10 Years): 0
</>
Publications
</>
Frederic Duvivier
Automatic Detection of Spatial Signature on Wafermaps in a High Volume Production.
DFT
(1999)
Sandrine Barberan
,
Frederic Duvivier
Management of Critical Areas and Defectivity Data for Yield Trend Modeling.
DFT
(1998)
Sandra Levasseur
,
Frederic Duvivier
Application of a yield model merging critical areas and defectivity to industrial products.
DFT
(1997)
Frederic Duvivier
,
Gerard A. Allan
Application of a Survey Sampling Critical Area Computation Tool in a Manufacturing Environment.
DFT
(1996)
Frederic Duvivier
,
M. Rivier
Approximation of critical area of ICs with simple parameters extracted from the layout.
DFT
(1995)
Frederic Duvivier
,
M. Rivier
,
B. Burtschy
,
J. J. Charlot
Use of a Segmentation Technique to Analyze the Variability of the Yield of a Mature CMOS SRAM.
DFT
(1993)