Failure modes of tantalum capacitors made by different technologies.

Petr Vasina T. Zednicek Josef Sikula Jan Pavelka

Published in: Microelectron. Reliab. (2002)

Keyphrases

failure modes
human factors
data mining
fault tree
real time
image sequences
integrated circuit
databases
information retrieval
genetic algorithm
database systems
expert systems
web applications
learning systems
emerging technologies