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A Generic Data-Driven Nonparametric Framework for Variability Analysis of Integrated Circuits in Nanometer Technologies.

S. Mukhopadhyay
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2009)
Keyphrases
  • data driven
  • integrated circuit
  • data analysis
  • analysis tool
  • image analysis
  • quantitative analysis
  • image registration
  • low cost
  • main contribution
  • theoretical framework
  • model driven