Login / Signup

ESD Capability Analysis of High-voltage nLDMOSs by the Bulk Terminal Modulation.

Jhong-Yi LaiShen-Li ChenZhi-Wei LiuXing-Chen MaiYu-Jie Chung
Published in: ICCE-TW (2022)
Keyphrases
  • high voltage
  • real time
  • machine learning
  • training data
  • expert systems
  • pairwise
  • fuzzy logic
  • small number
  • decision support system
  • operating conditions