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The effect of design parameters on single-event upset sensitivity of MOS current mode logic.

Mahta HaghiJeff Draper
Published in: ACM Great Lakes Symposium on VLSI (2009)
Keyphrases
  • design parameters
  • design space
  • event detection
  • neural network
  • real time
  • data mining
  • knowledge base
  • design process
  • modal logic