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Examining the role of tap cell in suppressing single event transient effect in 28-nm CMOS technology.

Chenyu ZhangYan LiWenfa ZhanWenping GengTing LiangXiaoyang Zeng
Published in: Microelectron. J. (2024)
Keyphrases
  • cmos technology
  • low power
  • spl times
  • silicon on insulator
  • power consumption
  • parallel processing
  • power dissipation
  • low voltage
  • high speed