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Uniform constant-depth threshold circuits for division and iterated multiplication.

William HesseEric AllenderDavid A. Mix Barrington
Published in: J. Comput. Syst. Sci. (2002)
Keyphrases
  • high speed
  • depth information
  • floating point
  • group testing
  • vlsi circuits
  • depth map
  • digital circuits
  • database
  • video sequences
  • gray level
  • threshold selection
  • logic synthesis
  • analog vlsi