Reconfigurable Leakage-based Weak PUF in 65nm CMOS with 0.63% instability.
Nimesh ShahArindam BasuPublished in: ISCAS (2023)
Keyphrases
- low cost
- silicon on insulator
- metal oxide semiconductor
- cmos technology
- low voltage
- leakage current
- low power
- nm technology
- electronic devices
- power consumption
- high speed
- power reduction
- reconfigurable architecture
- power supply
- general purpose
- floating gate
- hardware implementation
- real time
- vlsi circuits
- multi objective evolutionary
- circuit design
- delay insensitive
- random access memory
- digital signal
- parallel processing
- smart camera
- integrated circuit
- fine grain