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Switching characteristics of lateral-type and vertical-type SiC JFETs depending on their internal parasitic capacitances.
Nathabhat Phankong
Tsuyoshi Funaki
Takashi Hikihara
Published in:
IEICE Electron. Express (2010)
Keyphrases
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genetic algorithm
feature extraction
high quality
evolutionary algorithm
real time
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preprocessing
spatio temporal
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probability distribution