Special issue on robust multivariate analysis and classification.
Marco RianiAndrea CerioliBruno ChiandottoPublished in: Stat. Methods Appl. (2007)
Keyphrases
- special issue
- international journal
- machine learning
- ai edam
- ecml pkdd
- classification accuracy
- special section
- pattern recognition
- pattern classification
- applied intelligence
- feature extraction
- support vector
- decision trees
- classification algorithm
- classification method
- supervised learning
- text classification
- support vector machine
- classification models
- databases
- training samples
- image classification
- knowledge management
- feature vectors