Multithreaded and Reconvergent Aware Algorithms for Accurate Digital Circuits Reliability Estimation.

Walid Ibrahim Hazem Ibrahim

Published in: IEEE Trans. Reliab. (2019)

Keyphrases

digital circuits
computationally efficient
computational complexity
data sets
worst case
neural network
theoretical analysis
machine learning algorithms
databases
learning algorithm
computational cost
high accuracy
times faster
data structure
benchmark datasets