A Productivity Metric Based on Statistical Pattern Recognition.
Jody L. SharpeJoão W. CangussuPublished in: COMPSAC (1) (2005)
Keyphrases
- statistical pattern recognition
- pattern recognition
- reject option
- structural pattern recognition
- denoising
- distance metric
- neural network
- feature extraction
- distance function
- metric space
- evaluation metrics
- software development
- product quality
- minimum classification error
- quality metrics
- similarity metric
- metric learning
- hidden markov models
- feature selection